New York Rotten Apple Fitted Cap Pin | Enamel Pin For Hat
Size Chart
Free Hat Size Ruler:
For accurate measurement:
- Open image in new tab and print actual size.
- Cut out individual pieces and overlay 10" and 20" measurements and tape together.
- Wrap ruler around head with end labeled "Top," on top.
- Wrap as tight as possible, the measurement closest to the edge labeled Top is your size.
Hats.
Short sleeve cotton t-shirts.
Mitchell and Ness Jerseys.
Mitchell and Ness Shorts.
Details
- Rotten Apple
- Fitted Cap Pin
- Enamel
- New York City Inspired
Description
Show love for New York with this New York Rotten Apple Fitted Cap Pin. This New York Rotten Apple pin is one of the enamel pins for hats that we have available and is a great choice for anybody that is looking for dope-looking pins for hats, specifically 59fifty fitted caps from New Era. This New York Rotten Apple pin for fitted hats will go great with any New York Yankees 59Fifty Fitted Cap. In case you were wondering where to put pins on fitted hats, New Era hat pins like this New York Rotten Apple pin can be rocked either by putting the pin through the eyelet (air hole, at the top) or directly through the material on the front or sides of the fitted. Just keep in mind that if you go directly through the material you may leave a hole. This New York Rotten Apple fitted cap pin is just one of the many enamel pins for fitted hats that we have available. We've designed a large selection of custom pins for hats and have a wide variety of hat pins for sale, regardless of whether you're looking for fitted cap pins or just pins for baseball caps in general. Whether you're a native of New York or a fitted cap enthusiast and are thinking about putting pins on hats, this New York Rotten Apple Fitted Cap Pin is a great place to start!
Shipping policy
Most orders ship within several business days of being placed, after a label is generated, tracking information is emailed. All orders are shipped via USPS Standard Shipping (5-7 Business Days), price varies by weight.
